李彤

作者:时间:2025-09-03点击数:

姓名:

李彤

 

职称:

副教授

邮箱:

jiaojiao2333@icloud.com

研究方向

磁光学,自旋光子学,弱测量,自旋电子学,有机微电子

主要工作经历

2025.07-至今,贵州工程应用技术学院,机械工程学院

教育背景

2014.09-2018.06,四川大学物理学院,微电子科学与工程,工学学士

2018.09-2021.06,四川大学物理学院,微电子学与固体电子学,工学硕士

2021.09-2025.06,四川大学物理学院,物理学,理学博士

代表性科研成果

1. 发表论文

[1] Tong Li, Yunhan Wang, Yinghang Jiang, et al. High-precision measurement of the complex magneto-optical Kerr effect using weak measurement. Applied Physics Letters, 2024, 124(5): 054001. 

[2] Tong Li, Lan Luo, Xinrui Li et al. Observation of the mixed magneto-optical Kerr effects using weak measurement. Optics Express, 2023, 31(15): 24469. 

[3] Tong Li, Qi Wang, Ayoub Taallah, et al. Measurement of the magnetic properties of thin films based on the spin Hall effect of light. Optics Express, 2020, 28(20): 29086. 

[4] Tong Li, Yanhao Xu, Zhaowei Zhang, et al. Self-assembly prepared millimeter length ferromagnetic carbon nanotubes with spin nontrivial electronic transport properties. ACS Applied Electronic Materials, 2020, 2: 491-498. 

[5] Lan Luo, Tong Li, Tianchen Li, et al. Complex signal measurement based on weak measurements. Optics Express, 2025, 33(11): 22511-22523.

[6] Changyou Wang, Tong Li, Sijie Zhang, et al. Characterization of aligned polymers using the spin hall effect of light. Polymers, 2025, 17: 958.  

[7] Jixin Gong, Tong Li, Boyu Cao, et al. Photoelectronic synaptic transistors with tuneable synaptic plasticity based on films of P3HT with ordered polymer chains. Materials Research Express, 2024, 11(7): 076404. 

[8] Lan Luo, Tong Li, Yinghang Jiang, et al. Estimation of Kerr angle based on weak measurement with two pointers. Optics Express, 2023, 31(9): 14432-14441. 

[9] Qi Wang, Tong Li, Lan Luo, et al. Measurement of hysteresis loop based on weak measurement. Optics Letters, 2020, 45(5): 1075-1078.

[10] Changyou Wang, Yunhan Wang, Yurong Li, Tong Li*, et al. Ultrasensitive probing of nematic order parameter via weak measurement. Applied Physics Letters, 2025, 126: 034001. 

2. 授权专利

一种基于光自旋霍尔效应的磁性测量方法(发明专利,专利号:ZL201910751927.1)(第一发明人)

基于量子弱测量的有序度测量系统及方法(发明专利,申请号:202411146471.3)(第二发明人)

 

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